• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    A spectrometer, particularly for mounting in a sensor module of a fluid analysis system, comprises a radiation source and the following components which define a ray path or which are arranged along the path of the rays: a sample space (26) for a fluid to be examined, a first lens (44), a diffraction element (48), a second lens (50) and a detector (52). A limiting aperture (46) for limiting the effective diameter of the incident light beam on the diffraction element (48) is provided between the sample space (26) and the diffraction element (48).
    公开号:FR3017210A1
    申请号:FR1550709
    申请日:2015-01-29
    公开日:2015-08-07
    发明作者:Martin Garbos；Christoph Scholl
    申请人:Buerkert Werke GmbH and Co KG；
    IPC主号:
    专利说明:

    [0001] The invention relates to a spectrometer, in particular for mounting in a sensor module of a fluid analysis system. The invention further relates to a fluid analysis system comprising a spectrometer of this type. Spectrometers are very important for the analysis of fluids, especially (drinking) water, since they allow important parameter measurements without contact and with or without the addition of additives. The measurement of the spectral absorption coefficient (SAC, for example, spectral absorption coefficient), for example at 254 nm, or the measurement of the organic carbon content (TOC, English: total organic carbon) are for example part thereof. Analyzer devices are desired which have a plurality of sensor modules and / or exchangeable sensor modules which must be as small as possible. The compact structure of spectrometers with inexpensive components (lens, grid and openings), however, brings disadvantages. In particular, the large curvature of the image field on which the spectrum is represented is problematic. The large curvature is the result of the narrow mounting space that requires lenses with limited focal lengths and therefore small lens rays.
    [0002] The object of the invention is to present a compact spectrometer with improved resolution of the spectrum shown. This object is achieved by means of a spectrometer having the features of claim 1. Advantageous and functional embodiments of the spectrometer according to the invention are indicated in the dependent claims. The spectrometer according to the invention is in particular provided for mounting in a sensor module and comprises a radiation source as well as the following components which define a path of the rays or which are arranged along the path of the rays: a space to samples, a first lens, a diffraction element, a second lens and a detector. According to the invention, a limiting opening for limiting the effective diameter of the incident light beam on the diffraction element is provided between the sample space and the diffraction element. With respect to the path of the radii from the radiation source, the named components are preferably arranged in the indicated order, the limiting aperture being either in front of or behind the first lens, which will be further explained. more detailed in the following. The spectrometer can of course comprise other components without this leaving the scope of the invention.
    [0003] The terms "radiation" and "light" are used as synonyms in the following regardless of the wavelength of the radiation emitted by the radiation source. The interior space of a vessel, a channel for an agent or other suitable container for receiving the fluid which is preferably fluid-permeable, can serve as a sample space for the fluid to examine. The lenses of the spectrometer according to the invention are in particular convex lenses, that is to say lenses with positive refraction, preferably plano-convex lenses which convert a parallel light beam into a convergent light beam. In particular, a reflection grid, a transmission grid or a prism can be envisaged as a diffraction element. The effective diameter of the incident light beam on the diffraction element is considered in a plane perpendicular to the optical axis, the optical axis being for example defined by an inlet opening arranged between the radiation source and the space to be samples, and by the first lens, or only by the first lens, and indicating at least up to the diffraction element the main direction of the ray path. More precisely, the maximum length of the light beam in the direction in which the decomposition into spectral components is carried out (possibly after a deflection) is considered as effective diameter, without taking into account whether the light beam is circular, oval or formed of light. 'another way. The invention is based on the conclusion that a very good resolution can also be obtained with a small spectrometer having simple (inexpensive) components. According to the invention, the limiting aperture which limits the effective diameter of the incident light beam on the diffraction element is responsible for the improved resolution. As in each current optical spectrometer, the light incident on the diffraction element is divided into its spectral colors by the diffraction element before being focused on a light-sensitive detector for the wavelength range relevant to the diffraction element. way of a second lens. The limiting aperture causes only a very narrow light beam to be incident on the diffraction element. Optical defects in the detector plane due to unavoidable image field curvature are thus greatly reduced, i.e. the resolution or sharpness of the spectrum shown is greatly improved. Other representation defects such as chromatic or spherical aberration are also greatly reduced.
    [0004] To obtain a significant improvement in resolution especially by using a first lens with a relatively large diameter, the width of the limiting aperture should in this case be significantly smaller than the diameter of the first lens. For preferred applications of the invention, a width of the limiting aperture of between 0.1 and 1.5 mm, preferably between 0.1 and 1.0 mm, is proven. According to a preferred embodiment of the invention, the focal length of the first lens is in the range of centimeters, preferably between 3 and 7 cm. The focal length of the second lens may also be in the range of centimeters, preferably between 2 and 5 cm. The improvement of the resolution correlates with a sharpness factor defined as S = RB / d, with RB = image field radius and d = width of the limiting aperture. For usable results, the sharpness factor is preferably greater than 10 and preferably between 30 and 70.
    [0005] As already mentioned above, there are in principle two possibilities for the arrangement of the limiting opening. The first possibility provides an arrangement of the limiting aperture between the first lens and the diffraction element. In this area behind the first lens, which is also called Fourier space, the light of the radiation source is collimated. This is the reason why the distance between the limiting aperture and the collimating lens can be practically selected as desired, which allows a greater freedom of realization. The limiting aperture may for example be formed by a narrow light channel in a component preferably also serving as a fastener for the first lens. The component then performs two functions. In a particularly space-saving embodiment, the limiting aperture can be made in a layer which is applied on one side of the first lens, and which is turned towards the diffraction element, that is to say that the layer is interrupted at the location of the limiting opening. The second possibility for the placement of the limiting aperture is to arrange it in the path of the rays directly in front of the first lens. In this case, the limiting aperture must be as close as possible to the first lens, because the light of the radiation source is not yet collimated by the first lens there. The limiting aperture can also be made in a space-saving manner in a layer applied to the face of the first lens, which is turned towards the sample space, that is to say that the layer is interrupted at the place of limitation opening. In particular when the first lens is extremely small, for example in a range of 0.1 to 1.5 mm, preferably 0.1 to 1.0 mm, but not exclusively, the limiting aperture can simply be formed by a clip directly surrounding the first lens. A linear detector, in particular a line sensor, is preferably used as a detector, since such a detector requires little mounting space and a two-dimensional planar detector is not necessarily necessary for the detector. Spectrum entry. In preferred embodiments of the invention, the maximum extent of the optically sensitive area of the detector may be in the range of centimeters, preferably between 1 and 4 cm. In particular, for uses in the field of water analysis, in which the agents to be detected are present only at very low concentrations, it may be necessary or at least advantageous for the light of the source of the radiation uses a trajectory as long as possible through the fluid. This is the reason why the sample space may have a length of several centimeters in the direction of the ray path, preferably a length of more than 4 cm. For the analysis of flowing fluids, it is advantageous to have a structure in which the sample space is connected to a supply channel and an evacuation channel, both of which preferably open into the chamber. sample space through annular conduits, the annular conduits being made in a housing surrounding the sample space. The diffraction element of the spectrometer according to the invention is preferably designed as a reflective grid. In addition to the diffraction necessary for the analysis, the reflective grid also ensures a deflection of the light beam. Thanks to an appropriate arrangement of the reflective grid, it is possible to arrange the following components next to the above components, so that the mounting space in the direction of the optical axis can be shortened. The diffraction element as a diffraction grating may also be coated with a suitable slot geometry or be made as narrow as a slot.
    [0006] For many uses, a xenon flash lamp whose light ranges from ultraviolet to infrared is suitable as a source of radiation. According to a first type of structure of the spectrometer according to the invention, an additional inlet opening is arranged in the ray path, preferably more or less directly behind the radiation source. Such an input opening ensures that the input of the light used for the measurements is always exactly in the same place in the spectrometer. A particularly compact structure results from an arrangement in which the sample space is arranged behind the entrance opening in the ray path. The sample space is thus integrated into the spectrometer itself, whereby the mounting volume is reduced overall. The invention also provides a fluid analysis system comprising a spectrometer of the type mentioned above. When the spectrometer according to the first type of structure mentioned above has an inlet opening, this has the disadvantage that the inlet opening must be oriented exactly towards the source of radiation, which presupposes an effort of corresponding mounting. In a particular development of the invention, the structure of the spectrometer according to the invention is simplified in this respect. According to this second type of simplified structure, no inlet opening is provided between the radiation source and the sample space of the spectrometer. The fluid analysis system may however comprise in this case an electronic unit made to take into account an offset of the spectra captured by the detector during the evaluation of several (successive) measurements. Thus, the missing inlet opening and its orientation are replaced by a mathematical process.
    [0007] An initial calibration may preferably be performed by associating a characteristic maximum of the spectrum with a pixel of a sensor of the detector. On the basis of this pixel, other pixels of the sensor are then fixedly associated with corresponding wavelengths. Ideally, each measurement can be calibrated or corrected individually by means of a selected characteristic area of the spectrum entered, in the form of an evaluation window defined by a range of wavelengths or a range of pixels of the sensor corresponding to the range of wavelengths, and by a range of intensity. In most cases, the simplest may be to calculate an offset between different measurements by means of the position of a maximum of the spectrum within the evaluation window. A corrected wavelength axis is determined for each spectrum entered, and the average of these measurements is calculated after this adjustment. According to an overall structure which is advantageous, the fluid analysis system according to the invention may comprise a sensor module in which at least one spectrometer according to the invention is mounted, and an analysis unit. The sensor module is then able to be fixed in the analysis unit by means of a stop flange while simultaneously making electrical and fluidic connections. The assembly and connection of the sensor module is thus considerably simplified.
    [0008] Other features and advantages of the invention will become apparent from the following description and the accompanying drawings to which reference is made. The drawings show: FIG. 1 is a perspective view of a modular fluid analysis system having a sensor module according to the invention; FIG. 2 is a perspective view of a sensor module according to the invention; - Figure 3 a sectional view of a sensor module according to the invention having a spectrometer according to the invention; FIG. 4 is an example for the flow course of the fluid to be examined in the sensor module; FIG. 5 shows a ray path through a spectrometer without a second opening, which does not correspond to the invention; FIG. 6 shows the trajectory of the rays through a spectrometer according to the invention, which has a second opening; FIGS. 7a to 7f show other examples of arrangement and construction of the second opening; - Figures 8a to 8f show different embodiments of the geometric shape of the second opening; FIG. 9 shows two ray trajectories through a spectrometer according to the invention, represented in a simplified manner according to a type of alternative structure; FIG. 10 is a schematic representation of a portion of two spectra captured by the detector in the form of successive measurements; FIG. 11 shows three spectra measured in a diagram in which the intensity of light is related to the position of the pixels of the sensor of the detector; and FIG. 12 is a mean spectrum reported in the chart without correction of the y-axis, and a mean spectrum with the corrected y-axis. FIG. 1 represents a fluid analysis system 10 with a modular structure, which comprises an electronic unit, here in the form of an electronic module 12 with a display screen 14, as well as an analysis unit, here in the form of a analysis module 16. One or more sensor modules 18 may be mounted in the analysis module 16. The mounting is carried out in a simple manner by means of a stop flange 20 fixed to the sensor module 18. In FIG. in addition to the fixing of the sensor module 18 in the analysis module 16, all the necessary electrical and fluidic connections are at the same time performed during the locking of the stop flange 20. An individual sensor module 18 with the electronic connections 22 and the fluid connections 24a, 24b corresponding is shown in Figure 2. It is visible in Figure 3 that a compact spectrometer is housed in the sensor module 18. The spectrometer is used to examine a suitable fluid flow into and out of a space in samples 26 through channels (not shown in Figure 3). The radiation source 28 of the spectrometer is chosen according to the type of analysis desired. For example, a low-pressure mercury lamp may be provided, which emits ultraviolet rays with a primary peak at 254 nm, or a xenon flash lamp whose light is in the range of ultraviolet rays (from about 190 nm). ) to the infrared range (up to about 2000 nm). The term "light" is used here for the sake of simplicity, even when the radiation emitted from the radiation source 28 is outside the visible range. A small input window 30 of the radiation source 28 otherwise shielded, and an input aperture (hereinafter: first aperture) 32 of the spectrometer define an optical axis A. The width of the input aperture 32 is is in the range of (sub) millimeters and is for example between 0.1 and 1.0 mm. The light then enters the sample space 26, in which the fluid to be examined is located, through a front entrance window 34 which is translucent for the light of the radiation source 28.
    [0009] The sample space 26 is elongated, the dimension along the optical axis A being of the order of magnitude of several centimeters, for example 6 cm. Such a length in the direction of the ray path is necessary when the compounds to be detected are present only at a low concentration in the fluid.
    [0010] Sample space 26 may be the interior of a vessel or other housing surrounding a fluid channel. An example for supplying and discharging the fluid via annular ducts 36a, 36b in such a housing 38 is shown in FIG. 4. For a better visibility, only the fluidic connections 24a, 24b, the duct 40a and the exhaust channel 40b and the housing 38 with the front inlet window 34 and the exit window 42 arranged at the opposite end, through which the light is decoupled from the sample space 26 along the optical axis A, are shown here. In order to minimize the influences of scattered light, the housing 38 surrounding the sample space 26 is opaque if possible, which can be obtained for example by means of a coating in the case of a housing material (semi-) transparent. This is of course not valid for the areas of the input window 34 and the output window 42. To reduce the mounting volume, the sample space 26 is in any case integrated into the spectrometer, c that is, the sample space 26 is not in front of but behind the input aperture 32 of the spectrometer. The decoupled light out of the sample space 26 penetrates through a collimating lens (first lens) 44 and an additional limiting aperture (hereinafter: second aperture) 46. The focal length of the collimating lens 44 is in the range of centimeters and is for example 5 cm. As shown in FIG. 3, the second opening 46 is preferably arranged in the zone of the light beam in which the rays are collimated by the first lens 44 and are therefore parallel. The second opening 46 can however also be arranged just in front of the first lens 44, seen in the direction of the ray path, which will be explained in more detail in the following. The second opening 46 is preferably made in the form of a narrow slot whose longitudinal direction extends perpendicular to the plane of the paper in FIG. 3. The maximum extent of the slot perpendicular (transversely) to the longitudinal direction defines the width d of the second opening 46 (see for example Figure 8a) which is in the range of (sub) millimeters and is for example between 0.1 and 1.0 mm. The possible geometrical shapes of the second aperture 46 will also be explained in more detail in the following.
    [0011] Following the decomposition of the light by means of a diffraction element 48 in the form of a reflection grid, a transmission grid or a prism, in its spectral colors, it is focused on a light-sensitive detector 52 for the range. The focal length of the focusing lens 50 is again in the centimeter range and is, for example, 3.6 cm. The diffraction element 48 is preferably designed as a reflective grid so that the detector 52 need not necessarily be in the extension of the optical axis A, but can be arranged in a space-saving manner in the free space of the module The diffraction element 48 as a diffraction grating may also be coated with a slot geometry or be made as narrow as a slot.
    [0012] Detector 52 is preferably a space-saving line sensor having a one-dimensional arrangement of suitable detector elements. The length of the optically sensitive area in the detector plane 54 is in the centimeter range and is preferably 2.54 cm. The electrical signals of the detector 52 are processed in an evaluation unit of the sensor module 18 and / or of the electronic module 12 of the fluid analysis system 10. The results of the measurements are displayed on the display screen 14 of the module In the following, the importance of the second opening 46 for the quality of the measurement results is explained in more detail. For this purpose, the path of the rays shown in Figure 5 is first considered, in which there is no second opening. Such a configuration causes a strong curvature of the image field 56 particularly when inexpensive components (input aperture 32, lenses 44, 50, diffraction element 48) are used and a compact structure of the spectrometer is selected. The image field 56 is here the surface over which the scattered spectrum of the light is clearly represented. The radius RB of the image field 56 can be mathematically derived in a known manner from the focal lengths and refractive indices of the lenses 44, 50 by computing the so-called sum of Petzval. The sum of Petzval is generally defined as follows: with fi = focal length and ni = refractive index of the respective lens. The reciprocal value of the Petzval sum, rp, corresponds to the searched RB image field radius. As already mentioned, a relatively strong curvature of the image field 56 is obtained here because of the small size of the spectrometer and the small focal lengths thus required, which also means small lens rays. According to the above exemplary values, a value of 32 mm would be obtained for the image field radius RB assuming a refractive index of n = 1.54 of both lenses 44, 50. such curvature does not, however, accord with the planar arrangement of the detector elements of the line sensor (detector plane 54). As can be seen in FIG. 5, the detector plane 54 and the image field 56 coincide only at two locations, i.e., at all other locations, the resolution is suboptimal. The greater the curvature of the image field 56, the more the representation on the detector 52 is blurred. This is shown by way of example for four wavelengths λ1, λ2, λ3 and λ4 selected in any way in FIG. 5.
    [0013] It is certainly possible to obtain a high resolution for individual narrow spectral zones of particular interest by positioning the detector 52 appropriately with respect to the image field 56. For most applications, however, this is not the case. sufficient, especially when the requirements are high as regards the measurement result.
    [0014] The second aperture 46 is provided to allow a resolution as high as possible over a larger area of the spectrum, i.e. also to minimize blurring of other wavelength ranges. FIG. 6 shows the path of the rays through the spectrometer with the second opening 46. It is clearly visible here that the width d of the second opening 46 is significantly smaller than the diameter D of the collimating lens 44. It results from the comparison between FIG. 5 and FIG. 6 that because of the second opening 46, only a very narrow portion of the light beam directed in the same direction by the collimator lens 44 is incident on the diffraction element 48, that is to say that is, the maximum diameter of the light beam is strongly limited by the second opening 46 in the direction perpendicular to the optical axis A in the plane of the paper of FIG. 6. In other words: the effective diameter of the light beam is reduced to the width d of the second opening 46. The optical defects in the detector plane 54 caused by the curvature of the image field are thus considerably limited. This appears as an example for the wavelengths λ1, λ2, λ3 and λ4, all of which are clearly represented. It is obvious that the sharpness of the total representation increases with the decrease of an opening width d. Quantitatively, this can be expressed by a sharpness factor S which can be defined as follows: S = RB / d with RB = image field radius and d = width of the second aperture. The sharpness factor S is preferably greater than 10, a value between 30 and 70 being targeted. FIGS. 7a to 7f show alternative embodiments or arrangements of the second opening 46 with respect to the collimator lens 44 between the sample space 26 and the diffraction element 48. The second opening 46 can in principle be arranged either behind directly in front of the collimating lens 44. In the first case, when the second opening 46 is thus arranged in the zone in which the light is collimated (Fourier space), the distance between the second opening 46 and the collimating lens 44 or the diffraction element 48 can be practically selected as desired. In the second case, the second opening 46 is preferably placed as close as possible to the collimating lens 44. According to FIG. 7a, an opaque layer 58 is applied to the face of the collimating lens 44 which is turned towards the sample space 26, for example by evaporation under vacuum. A small orifice is provided as a second opening 46 in the layer 58 at the point of intersection with the optical axis A. In FIG. 7b, the second opening 46 is made in a separate component 60 arranged just in front of the collimator lens 44.
    [0015] This is also true for FIG. 7c, the second opening 46 being however arranged here behind the collimating lens 44. As already mentioned, the distance relative to the collimating lens 44 is not critical here. In the embodiment of Fig. 7d, there is provided an extremely small collimator lens 44 which is retained in a component 60. The second aperture 46 is here determined by the clip which directly surrounds the collimating lens 44. -14- A 7e, the second opening 46 is determined by a narrow light channel 62 in a component 60 arranged behind the collimator lens 44, which can also serve to hold the collimator lens 44. As shown in FIG. 7f, by analogy with the 7a, an opaque layer 58 may also be applied to the face of the collimator lens 44 which faces the diffraction element 48, which has a small aperture as the second aperture 46 at the point of intersection with the optical axis A. FIGS. 8a to 8f show possible geometric shapes of the second opening 46. In addition to the embodiments in the form of a slot, Circular layouts or other oval, but also square, rectangular or other polygon-shaped realizations are possible, if necessary in a larger number than the linear arrangement. Mainly the opening width d is in all cases responsible for the sharpness of the representation, which has the same size in all the embodiments shown. In all the embodiments shown in FIGS. 8a to 8f, the second opening 46 in a structure according to FIG. 3 or in a similar structure is always arranged in such a way that the opening width d is in a direction perpendicular to the axis optical A in the plane of the paper (see Figure 6). This means that the light beam, after having passed through the second opening 46, is narrower in this direction than in a direction perpendicular to it (as for example in the embodiments according to FIGS. 8a to 8d and 8f). The "effective" diameter of the light beam, however, is always the diameter in the direction of the opening width d.
    [0016] FIG. 9 schematically shows a type of alternative structure of the spectrometer described above, in which no input aperture 32 is provided between the radiation source 28 is the sample space 26. This simpler structure has certainly the advantage that the mounting force for the exact orientation of the inlet opening 32 relative to the radiation source 28 is no longer necessary. But bypassing the inlet opening 32, it is not always ensured that the light of the radiation source 28 always enters exactly the same place in the spectrometer. FIG. 9 shows for this purpose, by way of example, the path of the rays of a wavelength in a first measurement (continuous lines), and in a second measurement (dashed line). It is clearly visible that during the second measurement, the point of incidence on the sensor of the detector 52 is shifted with respect to the first measurement. Due to the "jump" of the electric arc of the radiation source 28, the spectrum captured by the sensor of the detector 52 shifts overall. It will be described in the following how the missing input aperture 32 and its orientation are "replaced" by a mathematical process.
    [0017] As described above, when a xenon arc lamp is used as a radiation source 28, its flash arc (electric arc) serves almost as an entrance slit of the spectrometric structure, which is briefly explained. A large number of radiation sources emit a characteristic spectrum with maxima at known and precisely defined wavelengths. These characteristic maxima can also be used for the initial calibration of the spectrometer. The detector sensor 52 on which are for example 3600 pixels, can only detect the brightness of each individual pixel and is in itself "colorblind". Only the combination of individual pixels at a respective defined wavelength allows the measurement of brightness in different wavelength ranges. The initial calibration is performed by associating a characteristic maximum with a pixel of the sensor. The set of other pixels is fixedly associated with the corresponding wavelengths on the basis of this "calibration pixel". A calibrated spectrometer is thus produced.
    [0018] Since the electric arc in the radiation source 28 is not stationary, the captured spectrum also jumps to the sensor correspondingly. Specifically, the spectrum shifts in measurement by measuring several pixels on the sensor due to variations in position of the arc. As a result, the association of wavelengths with pixels differs slightly from the actual calibration. Each measurement can ideally be calibrated or corrected by means of a chosen characteristic area (evaluation window). A simple addition average calculation, however, leads to loss of detail or degraded resolution: the spectrum is "spoiled". The problem is shown schematically in FIG. 10. The dashed line corresponds to the first measurement of a series of measurements (original). The dashed line corresponds to the next (off-set) measure. The simple addition of the measurements leads to the average value represented as a continuous (average) line. Important information from the series of measurements is thus lost, and the resolution of the spectrometer is degraded. Figure 11 shows three actual measurements with different lines (continuous, dotted, dashed) in a diagram. The evaluation window is in an area in which a characteristic peak of the easily identifiable spectrum must be in spite of any offset. The problem described above is solved by considering the measurements against each other and calculating their averages taking into account the lag in the evaluation. The offset can for example be calculated by means of the position of the maximum. A corrected wavelength axis is then determined for each spectrum, and the respective spectrum is added only after adaptation. The improved result of this method is shown in Figure 12, which represents the average of a spectrum, once without taking into account the offset, so without correction of the y-axis (not shifted at the pixel level), with a dashed line, and once taking into account the offset, so with a corrected y-axis (offset at the pixel level). In what follows, the course of the mathematical correction is sketched. The reception of a spectrum includes searching for the characteristic point within the determined evaluation window in which a characteristic area of the spectrum of the radiation source 28 is found with certainty. As shown in FIG. 10, the evaluation window is defined by an extension in the direction of the x and an extension in the direction of the y. The x-directional expansion is a zone of wavelengths or pixels, while the y-directional extension (intensity) is used for the secure identification of a characteristic location. The maximum value - within tolerances - is known. The evaluation window generally increases the reliability of a measurement. It is chosen so that the characteristic point always occurs in this area and is uniquely identifiable. The position of the first characteristic point is stored as a reference for a series of measurements. Then, other spectra are received, the characteristic point being respectively searched. The difference between the currently determined characteristic point and the reference of the series of measurements is calculated. The shifted spectra are then added. The next step is the calculation of the average value. On this basis, the sensor pixels are associated with a specific wavelength, and other application-specific calculations are performed using the average of the measurement series. In what follows, the features of the characteristic point are again briefly explained. This is a property of the radiation source (peak in the spectrum) that is independent of the sample to be examined. (In other uses, it would in principle also be possible to use a characteristic characteristic of the sample which is always constant). The characteristic point has a very high probability of occurring (of almost 100 (3/0), regardless of the sample to be examined.The characteristic point represents a known position within a defined evaluation window. -18- List of reference numbers 10 fluid analysis system 12 electronic module 14 display screen 16 analysis module 18 sensor module 20 stop flange 22 electronic connections 24a fluid connection 24b fluid connection 26 sample space 28 radiation source 30 inlet window 32 inlet opening (first opening) 34 inlet window 36a annular duct 36b annular duct 38 housing 40a supply duct 40b evacuation channel 42 exit window 44 first lens (collimating lens ) 46 limiting opening (second opening) -19- 48 diffraction element 50 second lens (focusing lens) 52 detector 54 detecting plane ur 56 image field 58 layer 60 component 62 light channel Optical axis d width of second aperture RB radius of image field rp reciprocal value of sum of Petzval f focal length n refractive index At wavelength D diameter of the first lens S sharpness factor
    权利要求:
    Claims (26)
    [0001]
    REVENDICATIONS1. Spectrometer, in particular for mounting in a sensor module (18), having a radiation source (28) and the following components which define a path of the rays or which are arranged along the path of the rays: a sample space (26) for a fluid to be examined, a first lens (44), a diffraction element (48), a second lens (50), and a detector (52), a limiting aperture (46) for limiting the diameter effective of the light beam incident on the diffraction element (48) being provided between the sample space (26) and the diffraction element (48).
    [0002]
    2. Spectrometer according to claim 1, characterized in that the width (d) of the limiting opening (46) is significantly smaller than the diameter of the first lens (44).
    [0003]
    3. Spectrometer according to claim 1 or 2, characterized in that the width (d) of the limiting opening (46) is between 0.1 and 1.5 mm, preferably between 0.1 and 1.0 mm.
    [0004]
    4. Spectrometer according to one of the preceding claims, characterized in that the focal length of the first lens (44) is in the range of centimeters, preferably between 3 and 7 cm, and / or in that the focal distance of the second lens (50) is in the centimeter range, preferably between 2 and 5 cm.
    [0005]
    5. Spectrometer according to one of the preceding claims, characterized in that a sharpness factor defined by S = RB / d, with RB = image field radius and d = width of the limiting aperture (46) is greater than 10 and is preferably between 30 and 70.-21 -
    [0006]
    Spectrometer according to one of the preceding claims, characterized in that the limiting opening (46) is arranged between the first lens (44) and the diffraction element (48).
    [0007]
    7. Spectrometer according to one of the preceding claims, characterized in that the limiting opening (46) is arranged in a Fourier space in which the light of the radiation source (28) is collimated.
    [0008]
    8. Spectrometer according to claim 6 or 7, characterized in that the limiting aperture (46) is formed by a narrow light channel (62) in a component (60) which preferably also serves as a fastener for the first lens (44).
    [0009]
    9. Spectrometer according to claim 6 or 7, characterized in that the limiting aperture (46) is made in a layer (58) applied on the face of the first lens (44), which is turned towards the diffraction (48).
    [0010]
    10. Spectrometer according to one of claims 1 to 5, characterized in that the limiting opening (46) is arranged on the path of the spokes, directly in front of the first lens (44).
    [0011]
    11. Spectrometer according to claim 10, characterized in that the limiting aperture (46) is made in a layer (58) applied on the face of the first lens (44), which is turned towards the sample space ( 26).
    [0012]
    12. Spectrometer according to claim 10, characterized in that the limiting opening (46) is formed by a clip directly surrounding the first lens (44).
    [0013]
    13. Spectrometer according to one of the preceding claims, characterized in that the detector (52) is a linear detector, in particular a line sensor.
    [0014]
    14. Spectrometer according to one of the preceding claims, characterized in that the maximum extension of the optically sensitive area of the detector (52) is in the range of centimeters, preferably between 1 and 4 cm.
    [0015]
    15. Spectrometer according to one of the preceding claims, characterized in that the sample space (26) has in the direction of the path of the rays a length of several centimeters, preferably of more than 4 cm.
    [0016]
    16. Spectrometer according to one of the preceding claims, characterized in that the sample space (26) is connected to a supply channel (40a) and a discharge channel (40b) which open into space with the samples (26) preferably by circular ducts (36a, 36b), the circular ducts (36a, 36b) being formed in a casing (38) surrounding the sample space (26).
    [0017]
    17. Spectrometer according to one of the preceding claims, characterized in that the diffraction element (48) is designed as a reflective grid.
    [0018]
    Spectrometer according to one of the preceding claims, characterized in that the radiation source (28) is a xenon flash lamp.
    [0019]
    19. Spectrometer according to one of the preceding claims, characterized in that an additional inlet opening (32) is arranged in the path of the spokes.
    [0020]
    20. Spectrometer according to claim 19, characterized in that the sample space (26) is arranged in the path of the rays behind the inlet opening (32).
    [0021]
    21. fluid analysis system (10), comprising a spectrometer according to one of the preceding claims.
    [0022]
    22. fluid analysis system (10) comprising a spectrometer according to one of claims 1 to 18, characterized in that no inlet opening (32) is provided between the radiation source (28). and the sample space (26), the fluid analysis system (10) further comprising an electronic unit which is constructed to account for an offset of the spectra captured by the detector (52) when the evaluation of several measures.
    [0023]
    A fluid analysis system (10) according to claim 22, characterized in that the electronic unit is constructed such that an initial calibration is performed by associating a characteristic maximum of the spectrum with a pixel of a sensor of the detector (52), and in that from this pixel other sensor pixels are fixedly associated with corresponding wavelengths.
    [0024]
    24. fluid analysis system (10) according to claim 23, characterized in that the electronic unit is made such that each measurement is calibrated or corrected individually by means of a selected characteristic area of the spectrum entered, under evaluation window form which is defined by a range of wavelengths or a range of pixels of the sensor corresponding to the wavelength range, and by a range of intensity.
    [0025]
    25. fluid analysis system (10) according to claim 24, characterized in that the electronic unit is made such that a difference between different measurements is calculated using the position of a maximum of spectrum within the evaluation window, a corrected wavelength axis being determined for each spectrum entered, and the average of the measurements being calculated after this adjustment.
    [0026]
    26. fluid analysis system (10) according to one of claims 21 to 25, comprising a sensor module (18) in which is mounted at least one spectrometer according to one of claims 1 to 19, and comprising a analysis unit, characterized by a stop flange (20) by means of which the sensor module (18) is able to be fixed in the analysis unit at the same time performing electrical and fluidic connections.
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    同族专利:
    公开号 | 公开日
    US9528877B2|2016-12-27|
    DE102015100395A1|2015-08-06|
    FR3017210B1|2020-02-28|
    US20150219495A1|2015-08-06|
    CN104819775A|2015-08-05|
    DE102015100395B4|2020-06-18|
    CN104819775B|2018-12-14|
    引用文献:
    公开号 | 申请日 | 公开日 | 申请人 | 专利标题
    US5680209A|1992-08-13|1997-10-21|Maechler; Meinrad|Spectroscopic systems for the analysis of small and very small quantities of substances|
    US20090250595A1|2006-02-21|2009-10-08|Bri Australia Limited|System for detecting one or more predetermined optically derivable characteristics of a sample|
    WO2011018749A1|2009-08-11|2011-02-17|Koninklijke Philips Electronics N.V.|Multi-spectral imaging|
    US7180588B2|1999-04-09|2007-02-20|Plain Sight Systems, Inc.|Devices and method for spectral measurements|
    EP1236981A1|2000-10-11|2002-09-04|Acterna Eningen GmbH|Optical spectrometer with variable bandwidth|
    US6839140B1|2002-07-03|2005-01-04|Los Gatos Research|Cavity-enhanced liquid absorption spectroscopy|
    DE10255022A1|2002-11-25|2004-06-17|Fiedler, Sven E.|Resonator-enhanced absorption spectrometer|
    US7554667B1|2005-08-25|2009-06-30|Ball Aerospace & Technologies Corp.|Method and apparatus for characterizing hyperspectral instruments|
    DE202008003977U1|2008-02-26|2009-07-02|Bürkert Werke GmbH & Co. KG|microspectrometer|
    CN102762966B|2010-04-29|2014-08-06|台湾超微光学股份有限公司|Optomechanical module of micro-spectrometer with conical slit and slit structure thereof|
    DE102011121183B4|2011-05-18|2014-02-27|Heraeus Electro-Nite International N.V.|Sampler for sampling from melts with a melting point greater than 600 ° C and method for sampling|
    US9618449B2|2012-02-03|2017-04-11|The Trustees Of Columbia University In The City Of New York|Optical analysis of emissions from stimulated liquids|DE102016205756A1|2016-04-07|2017-10-12|BSH Hausgeräte GmbH|Method for improved control of a water-conducting household appliance and suitable household appliance|
    DE102016210169A1|2016-06-09|2017-12-14|BSH Hausgeräte GmbH|Method for improved control of a water-conducting household appliance and suitable household appliance|
    DE102016211328A1|2016-06-24|2017-12-28|BSH Hausgeräte GmbH|Method for improved control of a water-conducting household appliance and suitable household appliance|
    DE102016114607A1|2016-08-05|2018-02-08|Infineon Technologies Ag|Fluid delivery system, apparatus and method|
    DE102016222095A1|2016-11-10|2018-05-17|BSH Hausgeräte GmbH|Method for improved control of a water-conducting household appliance and suitable household appliance|
    DE102017209135A1|2017-05-31|2018-12-06|BSH Hausgeräte GmbH|Method for controlling a water-conducting household appliance and suitable household appliance|
    DE102017215370A1|2017-09-01|2019-03-07|BSH Hausgeräte GmbH|Hand-held scanner for improved laundry detection, system with such a hand-held scanner and method for its operation|
    DE102017215949A1|2017-09-11|2019-03-14|BSH Hausgeräte GmbH|Hand-held device for improved laundry treatment, system with such a hand-held device and method for its operation|
    IT201700109143A1|2017-09-29|2019-03-29|Fondazione St Italiano Tecnologia|Arrangement to increase the spectral contrast of a VIPA spectrometer.|
    DE102017219806A1|2017-11-08|2019-05-09|BSH Hausgeräte GmbH|Hand scanner for improved spot detection, system with such a hand scanner and method of operation|
    DE102017127665A1|2017-11-23|2019-05-23|Heiko Langer|Water analysis arrangement and method for its operation|
    DE102017223324A1|2017-12-20|2019-06-27|BSH Hausgeräte GmbH|Method for operating a water-conducting household appliance with a spectrometer and suitable household appliance|
    DE102018203938A1|2018-03-15|2019-09-19|BSH Hausgeräte GmbH|Scanner, scanning system containing this scanner and method for sorting items to be treated|
    法律状态:
    2016-01-21| PLFP| Fee payment|Year of fee payment: 2 |
    2017-01-20| PLFP| Fee payment|Year of fee payment: 3 |
    2018-01-19| PLFP| Fee payment|Year of fee payment: 4 |
    2018-01-26| PLSC| Publication of the preliminary search report|Effective date: 20180126 |
    2019-01-23| PLFP| Fee payment|Year of fee payment: 5 |
    2020-01-21| PLFP| Fee payment|Year of fee payment: 6 |
    2021-01-21| PLFP| Fee payment|Year of fee payment: 7 |
    2022-01-19| PLFP| Fee payment|Year of fee payment: 8 |
    优先权:
    申请号 | 申请日 | 专利标题
    DE102014101269.0|2014-02-03|
    DE102014101269|2014-02-03|
    DE102015100395.3A|DE102015100395B4|2014-02-03|2015-01-13|Spectrometer and fluid analysis system|
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